Programs

Description

Semiconductors are used in almost all electronic devices. If the Silicon comes back from fabrication with failures, how to catch the failure. If the silicon's first failure is after certain period or certain cycles of use, how to catch this failure upfront. Hence DFT is needed that can make Observability and Controllability of any point in the circuit possible. As nodes get shorter and shorter beyond 28nm, 14nm, 10nm, 5nm, 3nm, the probability of failure is higher and DFT plays a crucial role in the Semiconductor development and usage cycle.